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2 Inch N-Type 4H-SiC Wafer | 50.8 mm Silicon Carbide Substrate
4 Inch C-Plane Sapphire Wafer – Single Crystal Al₂O₃, SSP/DSP
Aluminum Air-Sensitive XRD Sample Holder for Powder X-Ray Diffraction
Aluminum XRD Sample Holder for Powder X-Ray Diffraction
